Key Characterization Techniques for nanomaterials are based on *Microscopy*, *Spectroscopy*, and *Macroscopic*.

Let's different these characterization techniques in detail:
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*Microscopy Characterization Techniques*:

Microscopy is a category of characterization techniques, which uses photons*, *electrons*, *ions*, or *physical cantilever probes to explore the surface and morphology of a material. Common examples of microscopy techniques include:

Scanning electron microscopy (SEM) or Field emission SEM (FESEM)
Transmission electron microscopy (TEM)
Atomic force microscopy (AFM)
Scanning tunneling microscopy (STM)
X-ray diffraction topography (XRT)
Optical microscopy (light microscopy)
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*Spectroscopy Characterization Techniques*:

These characterization techniques use a range of principles to reveal the chemical composition*, *crystal structure*, and *optoelectronic properties of materials. Common examples of spectroscopy techniques include:

Ultraviolet-visible spectroscopy (UV-vis)
Fourier transform infrared spectroscopy (FTIR)
Steady state PL
Time resolved PL (TRPL)
X-ray diffraction (XRD)
Energy dispersive X-ray spectroscopy (EDS, EDX)
X-ray photoelectron spectroscopy (XPS)
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*Macroscopic Characterization Techniques*:

A range of techniques are used to characterize macroscopic properties of materials, and few of them are:

Differential scanning calorimetry (DSC)
Thermogravimetric analysis (TGA)
Mechanical testing i.e., tensile, compressive, torsional, fatigue, etc.